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Elektronik und Systemintegration

(Un-)sharpening deflectometry simulations by camera aperture ray tracing

Autoren

Simon Hartel
Prof. Dr. rer. Nat. Christian Faber

Medien

Proceedings Volume 13603, Applied Optical Metrology VI; 136030C (2025) https://doi.org/10.1117/12.3064380

Veröffentlichungsjahr

2025

Band

Optical Engineering + Applications 13603, 2025

Herausgeber

SPIE

Veröffentlichungsart

Konferenzbeitrag (peer reviewed)

Forschungsprojekt

KISSMe3D

Zitierung

Hartel, Simon; Faber, Christian (2025): (Un-)sharpening deflectometry simulations by camera aperture ray tracing. Proceedings Volume 13603, Applied Optical Metrology VI; 136030C (2025) https://doi.org/10.1117/12.3064380 Optical Engineering + Applications 13603, 2025.

Peer Reviewed

Ja

Elektronik und Systemintegration

(Un-)sharpening deflectometry simulations by camera aperture ray tracing